xv, 341 pages : 25 cm

"X-ray crystallography is a vital method for determining the structure of macromolecules. As the importance of solving protein structures continues to grow in fields ranging from basic biochemistry and biophysics to pharmaceutical development and biotechnology, more and more researchers have found that knowledge of X-ray diffraction is an indispensable tool. Professor Drenth, recognized internationally for his contributions to crystallographic research, has provided a technically rigorous introduction to the subject. This book provides the theoretical background necessary to understand how the structure of proteins is determined at atomic resolution. Suitable both as a text and reference work, Principles of Protein X-Ray Crystallography, Second Edition, is aimed at graduate students, postdoctoral researchers, and established scientists who want to apply protein crystallography in their own work or need to critically evaluate the literature. This second edition includes many new developments in the field that have occurred since the appearance of the first edition."--BOOK JACKET

Includes bibliographical references (pages 323-330) and index

Ch. 1. Crystallizing a Protein -- Ch. 2. X-ray Sources and Detectors -- Ch. 3. Crystals -- Ch. 4. The Theory of X-ray Diffraction by a Crystal -- Ch. 5. Average Reflection Intensity and Distribution of Structure Factor Data -- Ch. 6. Special Forms of the Structure Factor -- Ch. 7. The Solution of the Phase Problem by the Isomorphous Replacement Method -- Ch. 8. Phase Improvement -- Ch. 9. Anomalous Scattering in the Determination of the Protein Phase Angles and the Absolute Configuration -- Ch. 10. Molecular Replacement -- Ch. 11. Direct Methods -- Ch. 12. Laue Diffraction -- Ch. 13. Refinement of the Model Structure -- Ch. 14. The Combination of Phase Information -- Ch. 15. Checking for Gross Errors and Estimating the Accuracy of the Structural Model -- App. 1. A Compilation of Equations for Calculating Electron Density Maps -- App. 2. A Compilation of Reliability Indices -- App. 3. The Variation in the Intensity of X-ray Radiation

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